Pia Krog-Pedersen

+45 25459014



Kogle Allé 5

DK-2970 Hørsholm


Tel: +45 77305800


CVR/VAT#: DK29217939


Please feel free to download knowledge

Safety Data Sheet (SDS)

Reference material 0.01 S/m R03.001 (engelsk)

Reference material 0.1 S/m R03.002 (engelsk)

Reference material 1 S/m R03.003 (engelsk)

Reference material 10 S/m R03.004 (engelsk)

Reference material Primary pH buffer 'Phthalate' (pH = 4.005) R03.101 (engelsk)

Reference material Primary pH buffer '1:1 phosphate' (pH = 6.865) R03.102 (engelsk)

Reference material Primary pH buffer '1:3.5 phosphate (pH = 7.413) R03.103 (engelsk)

Reference material Primary pH buffer 'Borate' (pH = 9.180) R03.104 (engelsk)

Reference material Primary pH buffer 'Carbonate' (pH = 10.012) R03.105 (engelsk)


Manuscript for award winning paper

“Direct Traceability for Ultra-Pure Water Conductivity” by Hans D. Jensen, DFM

DFM has developed a geometrically characterised measurement cell, hence a primary standard relevant for ultra-low conductivity. A calibration setup with comparison to the primary cell established direct traceability to SI, without the need for assumptions on scaling properties or insignificant matrix effects...

Read more here



Nanometrology - an introduction | Poul-Erik Hansen DFM et al.

Why should we care about nanometrology?
Why is nanometrology important?
What are the main challenges for nanometrology?
Nanotechnology takes place at the atomic, molecular, meso- and microscopic levels where at least one dimension is below 100nm.
This guide introduces the reader to the science of measurements at the nanoscale, that is nanometrology.

Download here


Metrology in short

The main purpose of “Metrology – in short” 3rd edition is to increase awareness of metrology and to establish a common metrological frame of reference. It is meant to provide users of metrology with a transparent and handy tool to obtain metrological information.

Download it here